Optimal Test Clock Frequency Based Test Option Generation for Small Delay Defects
Small delay defects (SDD) based test escapes are caused by the nature of transition delay fault (TDF) ATPG, which propagates the fault effect along the shorter path in the interest of run time.However, owing to the benefits of a lesser pattern count Cooling and complexity, TDF ATPG is the most feasible option for delay testing.Faster than at-speed